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Advances in Imaging and Electron Physics

Advances in Imaging and Electron Physics

Buch | Hardcover
360 Seiten
2013
Academic Press Inc (Verlag)
978-0-12-407670-9 (ISBN)
CHF 296,75 inkl. MwSt
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Features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
Advances in Imaging and Electron Physics features cutting-edge articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 – 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.

Small Angle Scatter with Correlation, Scatter and Intermediate Functions
Jay Theodore Cremer, Jr.

Nuclear Scatter of Neutron Spin States
Jay Theodore Cremer, Jr.

Atomic-Resolution Core-Level Spectroscopy in the Scanning Transmission Electron Microscope
Christian Dwyer

Image Segmentation in the Field of the Logarithmic Image Processing (LIP) Model. Special Focus on the Hierarchical Ascendant Classification Techniques
Michel Jourlin, Josselin Breugnot, Bassam Abdallah, Joris Corvo, Enguerrand Couka and Maxime Carré

Point Spread Function Engineering for Super Resolution Single- and Multi- Photon Fluorescence Microscopy
Partha Pratim Mondal and Alberto Diaspro

Perspectives on Colour Image Processing by Linear Vector Methods using Projective Geometric Transformations

Stephen J. Sangwine

Erscheint lt. Verlag 18.3.2013
Reihe/Serie Advances in Imaging and Electron Physics
Mitarbeit Herausgeber (Serie): Peter W. Hawkes
Verlagsort San Diego
Sprache englisch
Maße 152 x 229 mm
Gewicht 600 g
Themenwelt Mathematik / Informatik Informatik Theorie / Studium
Naturwissenschaften Physik / Astronomie Atom- / Kern- / Molekularphysik
Technik Elektrotechnik / Energietechnik
Technik Maschinenbau
ISBN-10 0-12-407670-X / 012407670X
ISBN-13 978-0-12-407670-9 / 9780124076709
Zustand Neuware
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